Electrical Properties of Oriented SnO2 Thin Films
نویسندگان
چکیده
منابع مشابه
architecture and engineering of nanoscale sculptured thin films and determination of their properties
چکیده ندارد.
15 صفحه اولEffect of Thickness on the Electrical and Optical Properties of Sb Doped SnO2 (ATO) Thin Films
This work reports the preparation and characterization of (SnO2) thin films doped with 7 mol% Sb2O3. The films were prepared by the polymeric precursor method, and deposited by spin-coating, all of them were deposited on amorphous silica substrate. Then, we have studied the thickness effect on the microstrutural, optical and electric properties of these samples. The microstructural characteriza...
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The chemical bath deposition (CBD) technique was used for the synthesis of the tin oxide (SnO2) thin films. X-ray diffraction (XRD) was employed to find the crystallite size by using Debye Scherrer’s formula. The surface morphology of SnO2 films was analyzed by the scanning electron microscopic (SEM) studies. The FT-IR spectrum exhibits the strong presence of SnO2. The optical properties of the...
متن کاملStructural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
متن کاملStructural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
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ژورنال
عنوان ژورنال: Journal of the Ceramic Association, Japan
سال: 1986
ISSN: 1884-2127,0009-0255
DOI: 10.2109/jcersj1950.94.1091_699